From: Emil Gilliam (emil@emilgilliam.com)
Date: Mon May 12 2003 - 21:16:29 MDT
http://focus.aps.org/story/v11/st19
Researchers at Osaka University have used the tip of an atomic force
microscope (AFM) to remove a single silicon atom from a surface and then
replace it.
"The experiment, reported in the 2 May PRL, marks the first time single
atoms have been manipulated using a purely mechanical technique, rather than
one involving electric current."
"The method works with nonconducting materials, unlike past atom
manipulation techniques."
- Emil
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